x-ray diffraction peak profile analysis of maraged fe-ni-mn steels

X-ray diffraction peak profile analysis of maraged Fe-Ni-Mn steels

X-ray diffraction peak profile analysis was used to identify changes in the lattice distortions during isothermal aging of Fe-10Ni-7Mn (wt. %) maraging steel. Integral peak breadths were analyzed using classical Williamson-Hall equation taking the elastic anisotropy into account. It was found that substantial lattice distortions rise during precipitation hardening which depend strongly on the s...

Surface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis

An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...

+ x M O 2 ( M = Li , Ni , Mn , Fe

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Magnetic X-ray absorption fine structure for Ni-Mn alloys.

Magnetic X-ray absorption fine-structure (XAFS) spectra have been measured for Ni-Mn alloys. The magnetic XAFS in the near-edge region (X-ray absorption near-edge structure, XANES) and X-ray magnetic circular dichroism (XMCD) of the Mn and Ni K-edge for Ni(1-x)Mn(x) (x = 0.25, 0.24 and 0.20) show that (i) the local magnetic structure around the Mn atom is quite different from that around the Ni...

X-ray peak broadening analysis in LaMnO3+δ nano-particles with rhombohedral crystal structure

In this work, structural and magnetic properties of LaMnO3+δ compound prepared by citrate precursor method and annealed in presence of oxygen are investigated. The structural characterization of LaMnO3+δ by X-ray powder diffraction and using X’pert package and Fullprof program is evidence for a rhombohedral structure (R-3c space group) confirmed by FTIR measurement. The magnetic measurements sh...

X-Ray Diffraction Analysis of GaN/InGaN